The Russ College provides the JEOL JSM-6010PLUS/LA, which is available for use by interested researchers at Ohio University for characterization of metallic, ceramic, polymeric and composite materials. This instrument includes a microscope for geometric and morphological characterization of conductive and non-conductive samples as well as a spectroscope for elemental analyses and distribution. This instrument is complemented by the Denton Vacuum Desk V for pre-treatment of non-conductive samples prior to characterization.
CAPABILITIES OF THE EQUIPMENT:
Click image to view detailed PDF flyer.
Micro and nano-scale characterization of geometric and chemical distribution in sample
Qualitative elemental analyses for atoms larger than lithium via point, linear or areal mapping. Quantitative elemental analyses for atoms larger than oxygen.
Low vacuum mode for characterization of non-conducting samples without pre-treatment
SEM and EDS conducted within the same software, with the ability to switch from morphological to elemental characterization in seconds.
Export results in a variety of formats including .jpeg, .docx and .pptx for handling ease.
TRAINING/TECHNICAL HELP AVAILABLE OR REQUIRED TO USE EQUIPMENT?